The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Jul. 18, 2017
Nec Laboratories America, Inc., Princeton, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Kenji Yoshihira, Princeton Junction, NJ (US);
Guofei Jiang, Princeton, NJ (US);
Abstract
Systems and methods for anomaly detection in complex physical systems, including extracting features representative of a temporal evolution of the complex physical system, and analyzing the extracted features by deriving vector trajectories using sliding window segmentation of time series, applying a linear test to determine whether the vector trajectories are linear, and performing subspace decomposition on the vector trajectory based on the linear test. A system evolution model is generated from an ensemble of models, and a fitness score is determined by analyzing different data properties of the system based on specific data dependency relationships. An alarm is generated if the fitness score exceeds a predetermined number of threshold violations for the different data properties.