The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Jan. 09, 2018
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

Mark E. Barker, Johnston, IA (US);

Richard A. Humpal, Ankeny, IA (US);

Aaron A. Wells, Ankeny, IA (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05B 15/14 (2018.01); A01M 7/00 (2006.01); B05B 12/16 (2018.01); A01B 69/04 (2006.01); A01B 79/00 (2006.01); B05B 9/06 (2006.01); B05B 12/08 (2006.01); B05B 12/12 (2006.01); B64C 39/02 (2006.01); G05D 1/04 (2006.01); A01C 21/00 (2006.01); A01C 23/00 (2006.01); B05B 9/04 (2006.01); B05B 13/00 (2006.01);
U.S. Cl.
CPC ...
B05B 15/14 (2018.02); A01B 69/008 (2013.01); A01B 79/005 (2013.01); A01M 7/0089 (2013.01); B05B 9/06 (2013.01); B05B 12/082 (2013.01); B05B 12/12 (2013.01); B05B 12/16 (2018.02); B64C 39/024 (2013.01); G05D 1/042 (2013.01); A01C 21/005 (2013.01); A01C 23/008 (2013.01); B05B 9/0423 (2013.01); B05B 13/005 (2013.01); B64C 2201/042 (2013.01); B64C 2201/12 (2013.01); B64C 2201/148 (2013.01); B64C 2201/208 (2013.01);
Abstract

Wind speed, wind direction, and field boundary information are detected and used to identify a monitor area indicative of a likely overspray condition. Control signals are generated to obtain information from a sprayed substance sensor, in the monitor area. When an overspray condition is detected, an overspraying signal from the sprayed substance sensor indicating the detected overspray condition is received and overspray processing is performed, based upon the received overspray signal.


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