The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Jun. 06, 2016
Applicant:

The Hong Kong University of Science and Technology, Hong Kong, CN;

Inventors:

David Chuen Chun Lam, Hong Kong, CN;

Chi Hang Chon, Hong Kong, CN;

John Ching Kwong Kwok, Hong Kong, CN;

Matthew Ming Fai Yuen, Hong Kong, CN;

Zhen Qin, Hong Kong, CN;

Alexander Ka Ngai Lam, Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 18/12 (2006.01); A61B 18/14 (2006.01); A61B 17/221 (2006.01); A61B 17/22 (2006.01); A61B 18/00 (2006.01);
U.S. Cl.
CPC ...
A61B 18/1492 (2013.01); A61B 17/221 (2013.01); A61B 2017/22034 (2013.01); A61B 2018/0041 (2013.01); A61B 2018/00214 (2013.01); A61B 2018/00267 (2013.01); A61B 2018/00398 (2013.01); A61B 2018/00404 (2013.01); A61B 2018/144 (2013.01); A61B 2018/1475 (2013.01);
Abstract

A device is designed to remove blockages in a lumen such as a thrombus, blood clot, or embolus. The device comprises a manipulating wire and a structure that can conduct electrical current to a lumen blockage. The electrical current is preferably in radio frequency (RF). The RF electric current in the blockage can excite the contents such as proteins of the blockage, so that cross-linking density and interfacial adsorption of the entire blockage is enhanced. The enhanced cross-linking density can result in increased fracture resistance of the blockage such that fracture of the blockage during the removal process is unlikely. The enhanced interfacial adsorption results in increased interfacial fracture resistance between the device and blockage so that the blockage can be securely captured during the removal process without using radially applied force.


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