The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

May. 10, 2019
Applicant:

Hangzhou Fabu Technology Co., Ltd., Hangzhou, CN;

Inventors:

Xiaofei He, Hangzhou, CN;

Jeffrey Chu, San Diego, CA (US);

Hang Nguyen, Tempe, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); G06F 11/30 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0072 (2013.01); G06F 11/1076 (2013.01); G06F 11/3037 (2013.01);
Abstract

The present disclosure provides a method for checking a to-be-checked signal and related products. The method is applied in a checking device and includes: a first obtaining module, configured to obtain a to-be-checked signal carrying first control information, wherein the first control information is generated based on original control information; a second obtaining module, configured to obtain original checking information; a determining module, configured to determine the first control information according to the to-be-checked signal; and a checking module, configured to check correctness of the first control information according to the original checking information. The present disclosure can be used to enable reliability and functional safety on devices originally designed without features intended to support those functions.


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