The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10910084 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 02, 2021

Filed:

Mar. 21, 2012
Applicants:

Kathrin Thedieck, Lörrach, DE;

Annika Sonntag, Freiburg, DE;

Daryl Shanley, Gateshead, GB;

Piero Dalle Pezze, Newcastle upon Tyne, GB;

Inventors:

Kathrin Thedieck, Lörrach, DE;

Annika Sonntag, Freiburg, DE;

Daryl Shanley, Gateshead, GB;

Piero Dalle Pezze, Newcastle upon Tyne, GB;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 5/00 (2019.01);
U.S. Cl.
CPC ...
G16B 5/00 (2019.02);
Abstract

The present invention relates to a method for predicting the response of a structure, or a group of structures and/or a network profile, to a perturbation, in particular a perturbation caused by an agent or a combination of agents through modeling, optimizing, parameterizing, testing and/or validating of a dynamic network or of network perturbations.


Find Patent Forward Citations

Thedieck, Kathrin. (2021). Method for modelling, optimizing, parameterizing, testing and validating a dynamic network with network perturbations (U.S. Patent No. 10910084). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10910084

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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