The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

Jun. 27, 2019
Applicant:

The Chinese University of Hong Kong, Hong Kong, CN;

Inventors:

Shih-Chi Chen, Hong Kong, CN;

Yunlong Meng, Hong Kong, CN;

Jialong Chen, Hong Kong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/521 (2017.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01);
Abstract

The present disclosure discloses a method, a data acquisition and image processing system and a non-transitory machine-readable medium for obtaining a super-resolved image of an object. The method comprises: obtaining a plurality of structured images of the object by structured light; determining, from the structured images, modulation information of each structured light that comprises spatial frequency, phase shift and modulation factor; initializing a sample image of the object according the structured images and initializing structured pattern of each structured light by the corresponding modulation information; and restoring the image with improved resolution by adjusting the sample image and the structured pattern iteratively.


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