The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Oct. 02, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Daiki Kimura, Tokyo, JP;
Ryuki Tachibana, Yokohama, JP;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G16H 30/20 (2018.01); G06K 9/62 (2006.01); G06K 9/48 (2006.01); G06N 3/08 (2006.01); G06F 16/51 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06F 16/285 (2019.01); G06F 16/51 (2019.01); G06K 9/481 (2013.01); G06K 9/6215 (2013.01); G06K 9/6232 (2013.01); G06K 9/6284 (2013.01); G06N 3/08 (2013.01); G16H 30/20 (2018.01); G06T 2207/20084 (2013.01);
Abstract
Anomalies are detected by generating a reconstructed dataset from an original dataset by using a generative model, calculating a differential dataset between the original dataset and the reconstructed dataset as a differential dataset, determining at least one of a region of interest of the original dataset and a region of interest of the reconstructed dataset, weighting the differential dataset by using the determined region of interest, and detecting an anomaly by using the weighted differential dataset.