The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Feb. 27, 2015
Applicant:
Oath Inc., New York, NY (US);
Inventors:
Makoto Yamada, San Jose, CA (US);
Chao Qin, Sunnyvale, CA (US);
Hua Ouyang, Sunnyvale, CA (US);
Achint Thomas, Sunnyvale, CA (US);
Yi Chang, Sunnyvale, CA (US);
Assignee:
Verizon Media Inc., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/552 (2013.01);
Abstract
In one embodiment, a set of training data consisting of inliers may be obtained. A supervised classification model may be trained using the set of training data to identify outliers. The supervised classification model may be applied to generate an anomaly score for a data point. It may be determined whether the data point is an outlier based, at least in part, upon the anomaly score.