The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Mar. 14, 2018
Nec Corporation, Tokyo, JP;
Tetsuji Aoyama, Tokyo, JP;
Shunichi Kinoshita, Tokyo, JP;
Tomoki Nishikawa, Tokyo, JP;
Kazuhiko Kimura, Tokyo, JP;
Mitsuko Ooga, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An image monitoring system is provided with: a region forecast acquiring unit () for acquiring a region forecast which is predictive information about a predetermined item designated as a factor causing a change in a capture environment that is the environment of a capture region, wherein the predictive information serves as predictive information about the predetermined item at a future time in a predetermined region including the capture region where an image to be image-analyzed is captured; a change index specifying unit () for specifying, based on the acquired region forecast, a change index including at least a change timeslot that is a timeslot during which the change in the capture environment is brought about; and a detection sensitivity setting unit () for altering, based on the specified change index, a setup parameter that is a parameter for detecting an abnormality in the image analysis.