The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

Jan. 19, 2017
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yasumoto Mori, Joyo, JP;

Mamoru Egi, Otsu, JP;

Shota Miyaguchi, Nara, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 30/17 (2020.01); G05B 13/04 (2006.01); G05B 17/02 (2006.01); G06F 30/20 (2020.01); G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G06F 30/17 (2020.01); G05B 13/044 (2013.01); G05B 17/02 (2013.01); G06F 17/141 (2013.01); G06F 30/20 (2020.01); G05B 13/042 (2013.01); G05B 2219/37612 (2013.01); G05B 2219/42154 (2013.01); G05B 2219/42155 (2013.01); G05B 2219/42163 (2013.01);
Abstract

The present invention is suitable for easily properly setting control parameters in short time. The simulation device of the present invention comprises: a frequency response function computing part () computing a frequency response function according to a first command value and a measured value of a mechanical system; an impulse response computing part () computing an impulse response by performing inverse Fourier transform on the frequency response function obtained according to the frequency response function and the control parameters; and a time response outputting part () executing time response simulation of the mechanical system () according to a second command value and the impulse response.


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