The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

Jul. 02, 2018
Applicant:

Accenture Global Services Limited, Dublin, IE;

Inventors:

Colin Anil Puri, San Jose, CA (US);

Patrick Joyce, Wilmington, MA (US);

Brandon Eugene Humpert, San Jose, CA (US);

Stephen David Johnson, Brooklyn, NY (US);

Jonte Demetrio Craighead, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/55 (2013.01); G06N 20/00 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 16/254 (2019.01); G06F 21/552 (2013.01); G06N 20/00 (2019.01); H04L 63/1425 (2013.01); G06F 2221/034 (2013.01);
Abstract

According to an example, event anomaly analysis and prediction may include accessing a master directed graph that specifies known events and transitions between the known events, and ranking each of the known events. Each of the ranked known events may be clustered into a plurality of anomaly categories. A plurality of rules to analyze new events may be determined based on the plurality of anomaly categories. A determination may be made, based on an application of the plurality of rules to data that is to be analyzed for an anomaly, whether the data includes the anomaly. In response to a determination that the data includes the anomaly, a device associated with the data may be controlled.


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