The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Dec. 20, 2013
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Alkiviadis Simitsis, Santa Clara, CA (US);
William K. Wilkinson, San Mateo, CA (US);
Micro Focus LLC, Santa Clara, CA (US);
Abstract
Described herein are techniques for identifying a path in a workload that may be associated with a deviation. A workload may be associated with multiple measurements of a plurality of metrics generated during execution of the workload. The multiple measurements may be aggregated at multiple levels of execution. One or more measurements may be compared to one or more other measurements or estimates to determine whether there is a deviation from an expected correlation. If determined that there is a deviation, a path can be identified in the workload that may be associated with the deviation.