The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Mar. 08, 2019
Fanuc Corporation, Yamanashi, JP;
Shinichi Ogawa, Yamanashi, JP;
Nobutomo Itani, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
Provided are an equipment inspection system and an equipment inspection method, which are capable of preventing an operator from skipping inspection. The equipment inspection system includes: a host computer configured to accumulate information on inspection for an industrial machine; at least one information medium, attached to the industrial machine, storing information corresponding to an inspection item of the industrial machine; a reading device configured to read the information medium; and at least one portable terminal. The portable terminal includes: a display section configured to display the inspection item corresponding to the information of the information medium read by the reading device; an input section configured to allow an operator to input an inspection result of the displayed inspection item; and a communication section capable of communicating the input inspection result with the host computer.