The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Oct. 25, 2016
Landmark Graphics Corporation, Houston, TX (US);
Fan Xia, Katy, TX (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
An apparatus and a method for estimating interval anellipticity parameter by inversing effective anellipticity parameter in the depth domain using a least-squares method. One embodiment of interval anellipticity parameter estimator includes: 1) an interface configured to receive seismic data and borehole information; 2) a depth convertor configured to obtain a function of depth of effective anisotropy parameter based on said borehole information; 3) an inverse transformer configured to set up said function of depth of effective anisotropy parameter as a least-squares fitting problem based on said P-wave data; and 4) an iterative solver configured to use iterative methods to solve said least-squares fitting problem and to obtain an anisotropy model containing interval anellipticity parameter.