The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Jul. 29, 2017
Dirk Ertel, Forchheim, DE;
Yiannis Kyriakou, Spardorf, DE;
Dirk Ertel, Forchheim, DE;
Yiannis Kyriakou, Spardorf, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method for determining two-dimensional image data from at least one sectional surface of an acquisition volume as part of a magnetic resonance imaging process by a combined apparatus, including a magnetic resonance imaging facility and an X-ray facility, is provided. The method includes controlling the X-ray facility to acquire at least one X-ray image that images at least part of an object. At least one piece of object information is determined by image processing the X-ray image. At least one sectional-surface parameter that defines an arrangement of the sectional surface in the acquisition volume is determined. The magnetic resonance imaging facility is controlled to acquire measurement data relating to the sectional surface. The two-dimensional image data is calculated from the measurement data. The sectional-surface parameter is used as the basis for the control of the magnetic resonance imaging facility and/or for the calculation of the two-dimensional image data.