The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Nov. 28, 2018
Heraeus Quarzglas Gmbh & Co. KG, Hanau, DE;
Helmut Friedrich, Dieburg, DE;
Heraeus Quarzglas GmbH & Co. KG, Hanau, DE;
Abstract
Measurement methods are known for determining the concentration of an ingredient in a body of ceramic or glassy material, in which the optical path length or the signal propagation time of a measurement wave penetrating the body of ceramic or glassy material in a measurement direction is determined and evaluated. Starting therefrom, in order to indicate a non-destructive method for determining a concentration of an ingredient in a body of ceramic or glassy material, which is also suitable for measurement in the production process of the body concerned, it is suggested according to one embodiment that modulated gigahertz radiation is used as the measurement wave.