The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Feb. 02, 2015
Hitachi High-tech Corporation, Tokyo, JP;
Hirokazu Kato, Tokyo, JP;
Tomohiro Shoji, Tokyo, JP;
Satoshi Takahashi, Tokyo, JP;
Akira Maekawa, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
A multicolor fluorescence analysis device is provided. The device includes a first fiberoptic plate for guiding light including fluorescence emitted from a sample as a result of irradiation of excitation light and emitting the same from a first emission part. The device includes a second fiberoptic plate for receiving light emitted from the first emission part at a second incidence part, guiding the same, and emitting the same from a second emission part. The device includes a single multilayer dielectric interference film filter that is provided on an end surface of the second emission part, transmits at least a portion of the fluorescence, and transmits light of a plurality of transmission wavelength bands that do not include the excitation wavelength bands. The device includes a two-dimensional detection unit that is disposed so as to be adhered to the multilayer dielectric interference film filter.