logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10908069 B1

PDFFull Text
Date of Patent:
Feb. 02, 2021

Filed:

May. 17, 2017

In situ tribometer and methods of use

Applicant:

The Trustees of the University of Pennsylvania, Philadelphia, PA (US);

Inventors:

Robert W. Carpick, Philadelphia, PA (US);

Nitya Nand Gosvami, Philadelphia, PA (US);

Assignee:

The Trustees of the University of Pennsylvania, Philadelphia, PA (US);

Attorney:

Baker Botts, L.L.P.

Primary Examiner:

Alexander A Mercado

Int. Cl.
CPC ...
G01N 19/02 (2006.01); G01Q 60/26 (2010.01); G01Q 70/10 (2010.01); G01Q 30/14 (2010.01); G01Q 10/04 (2010.01); G01Q 60/24 (2010.01); G01Q 80/00 (2010.01);
U.S. Cl.
CPC ...
G01N 19/02 (2013.01); G01Q 60/26 (2013.01); G01Q 70/10 (2013.01); G01N 2203/0246 (2013.01); G01Q 10/04 (2013.01); G01Q 30/14 (2013.01); G01Q 60/24 (2013.01); G01Q 80/00 (2013.01);
Abstract

Techniques for determining a characteristic of a sample using an atomic force microscope including a cantilever having a probe attached thereto, including positioning the sample within a cell and sliding the probe over a sliding zone of the sample within the cell. Lateral and vertical deformations of the cantilever are detected using the atomic force microscope as the probe is slid over the sliding zone. One or more characteristics are determined based on the detected lateral deformations of the cantilever.

Find Patent Forward Citations

Carpick, Robert. (2021). In situ tribometer and methods of use (U.S. Patent No. 10908069). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10908069

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…