The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
Apr. 10, 2014
Acellent Technologies, Inc., Sunnyvale, CA (US);
Vishnuvardhan Janapati, Palo Alto, CA (US);
Sang Jun Lee, Santa Clara, CA (US);
Fu-Kuo Chang, Stanford, CA (US);
Irene Li, Stanford, CA (US);
ACELLENT TECHNOLOGIES, INC., Sunnyvale, CA (US);
Abstract
Methods and apparatuses for monitoring a first structure at least partially according to properties of a second structure. One such method comprises determining a first relationship between a first variable and a second variable, wherein the first variable represents sizes of actual damage to the second structure, and the second variable represents sizes of simulated damage on the second structure; determining a second relationship between a third variable and a fourth variable, wherein the third variable represents sizes of simulated damage on the first structure, and the fourth variable represents values of a damage index determined for the simulated damage on the first structure; and determining an estimate of damage to the first structure according to the first and second relationships.