The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2021
Filed:
May. 16, 2018
Oakland University, Rochester, MI (US);
Sergey F. Golovashchenko, Beverly Hills, MI (US);
OAKLAND UNIVERSITY, Rochester, MI (US);
Abstract
A method for measuring localized stretching of a manufactured part or in a test sample of various materials to identify the fracture strain or strain distribution. The method begins by etching or printing a grid of a plurality of cells on a surface of a blank. Dots of paint are then applied to the surface of the blank that are measured in a pre-forming condition and identified as to the location of the dots relative to the grid. The blank is then formed into a formed part and the dots are measured in one or more cells in a post-forming condition. The size of the dots in the pre-forming condition is compared to the size of the dots in the post-forming condition to determine the extent of stretching in localized areas of the formed part. The method may be repeated for successive operations with different colored dots.