The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Sep. 23, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Masaya Okada, Kobe, JP;
Shigeki Iwanaga, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/62 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
H04N 7/183 (2013.01); G06K 9/6201 (2013.01); G06T 3/4053 (2013.01); G06T 2207/10056 (2013.01);
Abstract
A method according to one or more aspects may control a microscope system including an imaging unit configured to image a sample, and a display unit including a first display region and a second display region. The method may include: sequentially displaying, in the first display region, first images sequentially captured by the imaging unit; and displaying, in the second display region, a second image generated based on information extracted from the sequentially captured first images.