The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Oct. 25, 2017
Applicant:

Conti Temic Microelectronic Gmbh, Nuremberg, DE;

Inventors:

Georg Arbeiter, Kueps, DE;

Stefan Milz, Sallburg-Ebersdorf, DE;

Johannes Petzold, Kulmbach, DE;

Joerg Schrepfer, Tettau, DE;

Sudhan Dhana Sekaran, Bamberg, DE;

Rodrigo Garcia Marques, Bamberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23238 (2013.01); G06T 3/4038 (2013.01); B60R 2300/102 (2013.01);
Abstract

A vehicle's panoramic view system includes a non-centered real camera that captures an image of surroundings, a virtual camera, an image processing unit, and a display unit that displays a geometric form overlaid over the captured image. The image processing unit projects the captured image onto a first plane perpendicular to the real camera to correct perspective distortions resulting from the camera's non-centered position, and projects the geometric form onto a second plane perpendicular to the virtual camera to represent the geometric form without distortion on the display unit. The image processing unit finds an affine transformation between the first and second planes by delta transformation between the real and virtual cameras, and applies the affine transformation to the first plane containing the projected distortion-corrected captured image, to align a modified representation of the image with the undistorted geometric form in the second plane.


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