The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Feb. 11, 2019
Applicant:

Osaka University, Suita, JP;

Inventors:

Ryoichi Horisaki, Suita, JP;

Jun Tanida, Suita, JP;

Riki Egami, Suita, JP;

Assignee:

Osaka University, Suita, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/00 (2006.01); G01N 21/47 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2256 (2013.01); G01J 9/00 (2013.01); G01N 21/47 (2013.01);
Abstract

An electromagnetic wave phase/amplitude generation device includes a radiation unit configured to radiate electromagnetic waves of a random radiation pattern on a spatial frequency in which a state of the electromagnetic waves to be radiated for each divided region is determined to an imaging object, an imaging unit configured to generate a captured image by imaging scattered electromagnetic waves that are electromagnetic waves generated when the imaging object scatters the electromagnetic waves of the radiation pattern radiated by the radiation unit, and a generation unit configured to generate information indicating at least a phase and amplitude of the electromagnetic waves from the imaging object by performing an arithmetic sparsity constraint operation according to sparsity of the imaging object on the basis of the captured image generated by the imaging unit, information indicating the radiation pattern, and information indicating a signal of the imaging object.


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