The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Mar. 08, 2018
Applicant:

Zscaler, Inc., San Jose, CA (US);

Inventors:

Loren Weith, San Jose, CA (US);

Deepen Desai, San Ramon, CA (US);

Assignee:

Zscaler, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04W 12/06 (2009.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); H04L 63/0227 (2013.01); H04L 63/145 (2013.01); H04L 63/1425 (2013.01); H04L 67/1097 (2013.01); H04W 12/06 (2013.01);
Abstract

Systems and methods for testing Signature Pattern Matching (SPM) for a new signature associated with a cloud-based security system with a plurality of nodes and a testing node include operating the testing node with a same management software and SPM library as the plurality of nodes; obtaining a new signature derived to detect malicious content; compiling the new signature in the SPM library for the testing node; implementing one or more test cases related to the malicious content to analyze behavior of the testing node with the SPM library containing the new signature; and, responsive to success in the one or more test cases, providing the SPM library to the plurality of nodes for detection of the malicious content.


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