The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Apr. 19, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Kambiz Azarian Yazdi, San Diego, CA (US);

Haitong Sun, Cupertino, CA (US);

Peter Pui Lok Ang, San Diego, CA (US);

Jay Kumar Sundararajan, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/345 (2015.01); H04W 72/04 (2009.01); H04L 5/00 (2006.01); H04W 24/08 (2009.01); H04W 72/12 (2009.01);
U.S. Cl.
CPC ...
H04B 17/345 (2015.01); H04L 5/0007 (2013.01); H04L 5/0048 (2013.01); H04L 5/0073 (2013.01); H04W 24/08 (2013.01); H04W 72/0446 (2013.01); H04W 72/1231 (2013.01);
Abstract

Aspects described herein relate to measuring cross-link interference in wireless communications. A portion of a slot that includes a downlink reference signal transmitted by a base station and an uplink reference signal transmitted by a user equipment (UE) can be determined, where the uplink reference signal and the downlink reference signal at least partially overlap within the portion of the slot. The downlink reference signal can be received from the base station and the uplink reference signal can be received from the UE in the portion of the slot. Cross-link interference between the downlink reference signal and the uplink reference signal can be measured.


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