The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Dec. 17, 2018
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Ordos Yuansheng Optoelectronics Co., Ltd., Ordos, CN;

Inventors:

Xiaowei Wang, Beijing, CN;

Guoqing Zhang, Beijing, CN;

Weifeng Wang, Beijing, CN;

Hongwei Gao, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); H01L 51/56 (2006.01); H01L 27/32 (2006.01); G02F 1/13 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G02F 1/1309 (2013.01); H01L 27/32 (2013.01); H01L 51/0031 (2013.01); H01L 51/56 (2013.01); H01L 27/3276 (2013.01);
Abstract

The present disclosure belongs to the field of display technology, and particularly relates to a test circuit, a display substrate, a test method of a display substrate and a display apparatus. The test circuit includes a signal generating device and a plurality of output channels that are mutually independent. Each output channel includes a signal line configured to transmit a test signal. The signal generating device is coupled to the plurality of output channels, and is configured to provide, to each of at least one of the plurality of output channels, the test signal corresponding to an impedance of the signal line in the output channel, and provide the test signal to the signal line in the output channel.


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