The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Oct. 28, 2016
Applicant:
Hp Indigo B.v., Amstelveen, NL;
Inventors:
Assignee:
HP Indigo B.V., Amstelveen, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 5/04 (2006.01); G06T 7/80 (2017.01); H04N 1/60 (2006.01); H04N 1/387 (2006.01); H04N 1/407 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/85 (2017.01); H04N 1/387 (2013.01); H04N 1/4076 (2013.01); H04N 1/603 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30176 (2013.01); G06T 2207/30204 (2013.01);
Abstract
In an example, two images of a printed calibration image are acquired using two measurement devices. The measurement devices are offset along an axis so that the two images correspond to two portions of the printed calibration image overlapping along the axis. The printed calibration image comprises a pattern extending across the printed calibration image in the direction of the axis, the pattern defining a shape so that in each image, a portion of the pattern appears as different from a straight line parallel to the axis. The two images are aligned using the two portions of pattern.