The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Oct. 26, 2017
Duke University, Durham, NC (US);
Jeremiah W. Sanders, Durham, NC (US);
Ehsan Samei, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Disclosed herein are systems and methods for determining quality metrics of images based on an edge gradient profile and characterizing regions of interest in an image or images. According to an aspect, a method includes using an imaging device to acquire one or more images including at least a portion of an organ of a subject. The method also includes computing an edge profile across an organ interface of a subject. The method also includes computing an edge gradient profile from the edge profile of a subject. The method also includes computing a image quality metric related to the spatial resolution of the image or images from the edge gradient profile. The method also includes defining multiple regions of interest within the portion of the organ. Further, the method includes characterizing the regions of interest based on predetermined criteria. The method also includes presenting the characterization of the edge gradient profile and characterization of the regions of interest to a user.