The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Jun. 22, 2017
Applicant:
Ultra Electronics Forensic Technology Inc., Montreal, CA;
Inventor:
Serge Levesque, Lachine, CA;
Assignee:
ULTRA ELECTRONICS FORENSIC TECHNOLOGY INC., Montreal, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/586 (2017.01); G01B 21/20 (2006.01); G07D 5/00 (2006.01); G07D 5/10 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01B 21/20 (2013.01); G06T 7/586 (2017.01); G07D 5/005 (2013.01); G07D 5/10 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30136 (2013.01);
Abstract
Detection of surface irregularities in coins. Three-dimensional topographic data of at least one surface of a coin, having at least one feature, is acquired and used to determine characteristics of the coin features, based on vector components of normal vectors at various points on the surface of the coin. The feature characteristics are then compared to reference feature characteristics. Based on this comparison, an irregularity indication is provided if differences between the feature characteristics and the reference characteristics are found.