The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Mar. 06, 2017
Mitsubishi Chemical Engineering Corporation, Tokyo, JP;
Kouji Kawano, Tokyo, JP;
Akio Ishikawa, Tokyo, JP;
Mitsubishi Chemical Engineering Corp., Tokyo, JP;
Abstract
A production process analysis method for stabilizing the quality of the products or services. A production process analysis method includes: a step for identifying a good lot included in a group determined to be the most excellent with respect to each of a plurality of states constituting a production process; a step for classifying, in the case where at least one good lot is not shared among the plurality of states, the plurality of states into an arbitrarily selected selection state and other non-selection states, and determining again a highest-ranking group in the non-selection state that includes the good lot in the selection state as the most excellent group; and a step for identifying factors that characterize the group determined as the most excellent.