The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Aug. 30, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ramasuri Narayanam, Bangalore, IN;

Gyana Ranjan Parija, New Delhi, IN;

Shrihari Vasudevan, Bangalore, IN;

Ritwik Chaudhuri, Bangalore, IN;

Sougata Mukherjea, New Delhi, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06313 (2013.01); G06Q 10/06393 (2013.01);
Abstract

Methods, systems, and computer program products for generating capacity planning schedules while protecting the privacy of stakeholder preferences of a set of metrics are provided herein. A computer-implemented method includes identifying stakeholders associated with capacity planning for a project; determining metrics to be used in the capacity planning; obtaining, from each of the stakeholders, an initial preferred order of emphasis of the metrics; calculating similarity scores between the initial preferred orders of emphasis; outputting, to each of the stakeholders, the similarity scores, wherein the identity of the stakeholders has been masked; obtaining, from each of the stakeholders, at least a second iteration of a preferred order of emphasis of the metrics; generating a final order of emphasis of the multiple metrics upon a determination that the stakeholders provided at least a predetermined number of identical preferred orders of emphasis; and outputting the final order of emphasis of the metrics.


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