The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Mar. 22, 2018
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Bolin Ding, Redmond, WA (US);
Harsha Prasad Nori, Bellevue, WA (US);
Paul Luo Li, Redmond, WA (US);
Joshua Stanley Allen, Bellevue, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Methods, systems, apparatuses, and computer-readable storage medium are described herein for remotely analyzing testing results based on LDP-based data obtained from client devices in order to determine an effect of a software application with respect to its features and/or the population in which the application is tested. The analysis is based on a series of statistical computations for conducting hypothesis tests to compare population means, while ensuring LDP for each user. For example, an LDP scheme is used on the client-side that privatizes a measured value corresponding to a usage of a resource of the client. A data collector receives the privatized data from two sets of populations. Each population's clients have a software application that may differ in terms of features or user group. The privatized data received from each population is analyzed to determine an effect of the difference between the software applications of the different populations.