The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Aug. 19, 2016
Skyhook Wireless, Inc., Boston, MA (US);
Farshid Alizadeh-Shabdiz, Wayland, MA (US);
Javier Velez, Cambridge, MA (US);
Skyhook Wireless, Inc., Boston, MA (US);
Abstract
In one example embodiment, an analysis application implements a technique for measuring a property of interest of an input dataset of location samples. The analysis application may process the input dataset in one or more multi-stage pipelines to produce values that measure a metric for the input dataset. The values that measure the metric for the input dataset may be compared with values that measure the metric for one or more labeled datasets that are generated by the analysis application, for example, using a feedback loop and sampling from a plurality of delta data sets. Each labeled datasets may have different values that measure the metric and corresponding measures of the property of interest. Based on the comparison, the analysis application may determine the measure of the property of interest for the input dataset and such measure may be returned, for example, to a remote device.