The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Feb. 25, 2019
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventor:

Axel Heim, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0416 (2013.01); G06F 3/017 (2013.01); G06F 3/044 (2013.01); G06F 2203/04101 (2013.01); G06F 2203/04104 (2013.01); G06F 2203/04108 (2013.01);
Abstract

A sensor system combining first and second detection systems supplies drive signals to nodes A and B electrodes of these systems. A drive sequence consists of a repetition of an elementary acquisition cycle having two consecutive main phases with pre-charge and acquisition phases. During a first pre-charge phase, node A is driven to a first electrical potential for and during a first acquisition phase, to a first intermediate electrical potential, and node B is driven to a second electrical potential and thereafter switches node B into high-impedance at DC, and during a second pre-charge phase, node A is driven to a third electrical potential and, during a second acquisition phase, to a second intermediate electrical potential, and node B is driven to a fourth potential and thereafter switches node B into high-impedance at DC. The first and second detection systems perform an electrical measurement on node A and B, respectively.


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