The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Oct. 04, 2019
Endress + Hauser Messtechnik Gmbh + Co. KG, Weil am Rhein, DE;
Dimitri Vaissiere, Wittersdorf, FR;
ENDRESS+HAUSER GROUP SERVICES AG, Reinach, CH;
Abstract
A method of determining a calibration or maintenance time interval after which a specific measurement device of a given type for measuring a quantity to be measured on a measurement site of an industrial site shall be re-calibrated or maintained is described, comprising the steps of: determining a criticality (C) of the specific device, based on the criticality (C) setting a reliability target (RT) for the device, wherein the reliability target (RT) denominates the probability of the device to be compliant according to a predefined criterion at the end of the calibration or maintenance time interval to be determined by this method, defining compliancy ranges for a measurable degree of compliance of the device, selecting a reliability model for a reliability of the device as a function of a normalized time interval (t) and a set of at least one parameter (c1, . . . , c) from a variety of predefined reliability models, determining a separate set of parameters for the selected reliability model for each of the compliancy ranges based on prescribed reliability expectation values (RV(t)) for each of the error ranges, which a reliability function associated with this error range shall comply to at at least one predefined normalized time (t), determining the degree of compliance of the specific measurement device and based on the degree of compliance determining the corresponding compliancy range, determining a normalized calibration or maintenance time (t) as the time, at which a reliability function (R(t)) given by the selected reliability model and the set of parameters determined for this compliancy range equals the reliability target (RT), and determining the next calibration or maintenance time interval based on a product of this normalized calibration or maintenance time (t) and a given reference time interval (T).