The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Jun. 20, 2017
Illumina, Inc., San Diego, CA (US);
Illumina Cambridge Limited, Cambridge, GB;
Gary Mark Skinner, Kedington, GB;
Geraint Wyn Evans, Cambridge, GB;
Stanley S. Hong, Menlo Park, CA (US);
John A. Moon, San Diego, CA (US);
M. Shane Bowen, La Jolla, CA (US);
Jonathan Mark Boutell, Bishops Stortford, GB;
Jason Richard Betley, Cambridge, GB;
ILLUMINA, INC., San Diego, CA (US);
ILLUMINA CAMBRIDGE LIMITED, Cambridge, GB;
Abstract
Example super-resolution microscopy systems are described herein that are configured for relatively high throughput. The disclosed microscopy systems can be to generate an array of sub-diffraction activated areas for imaging. The microscopy systems can be to utilize imaging techniques that employ time delay integration to build up super-resolution images over time. The disclosed microscopy systems can utilize long-lived fluorophores in conjunction with wide field and patterned illumination to generate super-resolution images of a sample with relatively high throughput.