The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Oct. 02, 2018
Applicant:

Facebook Technologies, Llc, Menlo Park, CA (US);

Inventors:

Niv Kantor, San Francisco, CA (US);

Nadav Grossinger, Foster City, CA (US);

Nitay Romano, Sunnyvale, CA (US);

Assignee:

Facebook Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 7/481 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/4815 (2013.01); H04N 5/2256 (2013.01);
Abstract

In one embodiment, a system includes at least one projector comprising a plurality of light emitters, where the projector is configured to project a projected pattern comprising a plurality of projected features having different locations; a camera configured to capture an image comprising a detected pattern corresponding to a reflection of the projected pattern; and one or more processors configured to: identify at least one detected feature of the detected pattern, wherein the detected feature corresponds to at least one reflection of the projected features; and activate or deactivate one or more of the light emitters based on the detected feature. The light emitters may be activated or deactivated by determining a detected feature measurement based on the detected feature, and activating or deactivating one or more of the light emitters when the detected feature measurement satisfies a threshold feature measurement condition.


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