The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Jul. 18, 2017
Applicant:

Kabushiki Kaisha Nihon Micronics, Tokyo, JP;

Inventors:

Masatomo Uebayashi, Oita, JP;

Akihisa Akahira, Oita, JP;

Tomoaki Kuga, Aomori, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/073 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2889 (2013.01); G01R 1/073 (2013.01); G01R 31/26 (2013.01); G01R 31/28 (2013.01); G01R 31/2818 (2013.01); G01R 31/2884 (2013.01);
Abstract

Provided is an electric connecting apparatusincluding a plurality of probes, a probe substrateconnected to base end portionsof the probes, and a probe support body, when tip end portionsof the probesare pressed by a device under test, preventing the adjacent probesfrom interfering. The probe support bodyincludes a plate-like guide portionincluding guide holes through which the probespass. The guide portionincludes an upper guide portion, a lower guide portion, and a middle guide portion. The probes pass through the guide holes of the upper guide portion, the middle guide portion, and the lower guide portionto be guided toward the device under test. The middle guide portionis provided to be movable in a perpendicular direction X perpendicular to a thickness direction Y.


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