The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Aug. 30, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Palkesh Jain, Bangalore, IN;

Rahul Gulati, San Diego, CA (US);

Edward Jacob Meisarosh, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/027 (2006.01); G06F 1/10 (2006.01); H03K 3/037 (2006.01); H03K 7/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0273 (2013.01); G06F 1/10 (2013.01); H03K 3/037 (2013.01); H03K 7/08 (2013.01);
Abstract

In one embodiment, a system including a duty-cycle-monitoring circuit is configured to receive a monitored signal having cycles that have a high portion and a low portion. The duty-cycle-monitoring circuit includes: a cascade of buffers including a first buffer, wherein the first buffer is configured to receive a first signal based on the monitored signal, a plurality of corresponding flip-flops. Each flip-flop is triggered by a second signal based on the monitored signal. The data input of each flip-flop is connected to an output of a corresponding buffer. The duty-cycle-monitoring circuit further includes a control circuit configured to determine, based on a state of the plurality of flip-flops, a measure of the duration of the high portion of a cycle of the monitored signal and determine, based on a state of the plurality of flip-flops, a measure of duration of the low portion of a cycle of the monitored signal.


Find Patent Forward Citations

Loading…