The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Aug. 09, 2017
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventor:

Sunil Sudhakaran, San Francisco, CA (US);

Assignee:

NVIDIA CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/167 (2006.01); G06F 17/12 (2006.01); G01R 31/28 (2006.01); G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
G01R 23/167 (2013.01); G01R 29/26 (2013.01); G01R 31/2822 (2013.01); G01R 31/2837 (2013.01); G01R 31/2841 (2013.01); G01R 31/2853 (2013.01); G06F 17/12 (2013.01);
Abstract

Embodiments of the present invention reconstruct a waveform at a receiver-end of a channel from an observed waveform physically measured at a probe point near the middle of the channel, where the channel is corrupted by reflections. The channel may be a memory channel of a high-speed I/O interface, for example. Equations to derive the waveform may be created using linear network analysis and/or signal processing, for example. S-parameters may be derived from simulated models representing components from the probe point to the load. The s-parameters together with the load impedance are used to recreate the desired waveform free from corruption due to reflections.


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