The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Sep. 25, 2017
Vanderbilt University, Nashville, TN (US);
Darryl J. Bornhop, Nashville, TN (US);
Vanderbilt University, Nashville, TN (US);
Abstract
Disclosed are methods, systems, and apparatuses for the free solution measurement of molecular interactions by backscattering interferometry. In one aspect, the invention relates to method and systems for detecting molecular interaction between analytes in free-solution wherein the analytes are label-free and detection is performed by back-scattering interferometry. Also disclosed are label-free, free-solution, and/or real-time measurements of characteristic properties and/or chemical events using the disclosed techniques. The disclosed methods can have very low detection limits and/or very low sample volume requirements. Also disclosed are various biosensor applications of the disclosed techniques. This abstract is intended as a scanning tool for purposes of searching in the particular art and is not intended to be limiting of the present invention.