The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Apr. 20, 2016
Applicant:
Stc.unm, Albuquerque, NM (US);
Inventors:
Andrew P Shreve, Santa Fe, NM (US);
Steven Wayde Graves, Santa Fe, NM (US);
Bruce S Edwards, Albuquerque, NM (US);
Jaime Javier Juarez, Albuquerque, NM (US);
Assignee:
UNM Rainforest Innovations, Albuquerque, NM (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01J 3/02 (2006.01); G01N 15/14 (2006.01); G01J 3/28 (2006.01); G01N 15/02 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01J 3/021 (2013.01); G01J 3/0205 (2013.01); G01J 3/0208 (2013.01); G01J 3/0291 (2013.01); G01J 3/0294 (2013.01); G01J 3/2823 (2013.01); G01N 15/0211 (2013.01); G01N 15/14 (2013.01); G01N 15/147 (2013.01); G01J 2003/2826 (2013.01); G01N 2015/1006 (2013.01);
Abstract
A method to simultaneously detect emission intensity or images at multiple distinct emission wavelengths in the analysis of parallel sample streams in a flow-based analysis system and apparatus for performing the described method.