The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Nov. 28, 2017
South China University of Technology, Guangdong, CN;
Feng Li, Guangzhou, CN;
Honglian Guo, Guangzhou, CN;
SOUTH CHINA UNIVERSITY OF TECHNOLOGY, Guangzhou, CN;
Abstract
The present invention discloses a far-field optical super-resolution microscopy method, and particularly relates to an optical super-resolution microscopy method for micro-structures on the surface of a sample. The present invention measures the vibration modes of different micro-samples via a laser interference vibrometer, and utilizes different eigen-vibration frequencies of the micro-structures on the surface of the sample to render, under the cooperation of a sub-nanometer two-dimensional displacement scanning translation stage, a high-resolution spatial position, an excitation frequency vibration spectrum and an image pattern, thus realizing super-resolution microscopy imaging. Since the present invention utilizes the different vibration frequencies of the micro-structures on the surface of the sample to perform marking, and adopts a laser to excite and detect the vibration of the micro-structures, the method has the characteristics of causing no mark, no damage and no contamination to the sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile