The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Sep. 20, 2019
Honeywell International Inc., Morris Plains, NJ (US);
Hugh Podmore, Ottawa, CA;
Alan Scott, Arnprior, CA;
Honeywell International Inc., Charlotte, NC (US);
Abstract
This disclosure is related to devices, systems, and techniques for precisely measuring a wavelength of an optical signal. For example, a wavemeter system includes processing circuitry, a detector array, a set of optical chips, and a coarse wavelength unit configured to generate a coarse wavelength measurement of the input optical signal. The processing circuitry is configured to select an optical chip from a plurality of optical chips. The detector array is configured to generate a partial interferogram based on the at least the portion of the input optical signal. The processing circuitry is further configured to calculate an optical spectrum of the input optical signal based on the partial interferogram corresponding to the at least the portion of the input optical signal and the calibration matrix and identify, based on the optical spectrum of the input optical signal, the precise wavelength of the input optical signal.