The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Jan. 10, 2017
Applicants:

Renishaw Plc, Wotton-under-Edge, GB;

Metrology Software Products Limited, Alnwick, GB;

Inventors:

Peter Russell Hammond, Warkworth, GB;

Christopher Leonard Copper, Alnwick, GB;

Assignees:

RENISHAW PLC, Wotton-under-Edge, GB;

METROLOGY SOFTWARE PRODUCTS LIMITED, Alnwick, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q 17/22 (2006.01); G01B 21/04 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/2233 (2013.01); G01B 21/042 (2013.01); G05B 19/401 (2013.01); G05B 2219/37008 (2013.01); G05B 2219/37619 (2013.01);
Abstract

A calibration device for a machine tool is described that includes a base attachable to a machine tool and a calibration artefact, such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact relative to the base when an external force is applied to the calibration artefact. The deflection mechanism also maintains the calibration artefact in a defined rest position relative to the base in the absence of an applied external force. A sensor is provided for sensing the extent of movement of the calibration artefact relative to the base. A method of using the device with a reference tool to accurately determine a position of a calibration artefact is also described.


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