The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Jan. 11, 2019
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Peter Michael Edic, Albany, NY (US);

Biju Jacob, Niskayuna, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/046 (2018.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/587 (2013.01); A61B 6/032 (2013.01); A61B 6/582 (2013.01); G01N 23/046 (2013.01); G01N 2223/303 (2013.01);
Abstract

The present disclosure relates to determining the position of an X-ray focal spot in real time during an imaging process and using the focal spot position to ensure alignment of the focal spot and high-aspect detector elements or to correct for focal spot misalignment, thereby mitigating image artifacts. For example, the focal spot position may be monitored and may be adjusted in real-time using electromagnetic electron beam steering during a scan. Alternatively, previously determined functional relationships between focal spot position and measured data may be applied to address or correct for focal spot misalignment in the acquired data.


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