The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Jun. 06, 2018
Applicant:

Olympus Corporation, Hachioji, JP;

Inventor:

Atsushi Yonetani, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); G02B 21/36 (2006.01); H04N 5/238 (2006.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2354 (2013.01); G02B 21/361 (2013.01); G02B 21/368 (2013.01); H04N 5/238 (2013.01); H04N 5/2352 (2013.01); H04N 5/23212 (2013.01); H04N 5/23293 (2013.01); H04N 5/2254 (2013.01); H04N 5/2256 (2013.01);
Abstract

An observation deviceincludes an imaging optical systemthat forms an image on the basis of light from sample S, an aperture diaphragmthat changes a numerical aperture on an emission side of the imaging optical system, a camerathat converts the image of the sample into image signals, the image of the sample being formed by the imaging optical system, an observation scope changing unit that performs an observation scope changing process in which an observation scope is changed to a specified scope by changing an extraction scope, the extraction scope being a scope from which the image signals obtained by the cameraare extracted, a monitorthat displays the image signals from the specified scope obtained through the observation scope changing process, and a control unit that controls the aperture diaphragmin accordance with the specified observation scope.


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