The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Apr. 17, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Hiroaki Motoshima, Kyoto, JP;

Kosuke Watanabe, Kyoto, JP;

Yasuhito Uetsuji, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/232 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2254 (2013.01); G02B 27/0025 (2013.01); H04N 5/2252 (2013.01); H04N 5/23296 (2013.01);
Abstract

An image sensor capable of performing satisfactory distortion aberration correction on an imaging result, regardless of a combination of a lens module and an imaging module being used, is provided. A main body module of an image sensor acquires form information of each module from an imaging module and a lens module which are mounted thereon, acquires size information indicating a number of pixels and/or a pixel size of an imaging element within the imaging module and distortion aberration characteristic information indicating distortion aberration characteristics of an optical system within the lens module from a predetermined device on the basis of the acquired form information, and performs distortion aberration correction using the acquired information.


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