The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Dec. 05, 2018
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Homayoun Bagherinia, Oakland, CA (US);
Luis De Sisternes, San Francisco, CA (US);
CARL ZEISS MEDITEC, INC., Dublin, CA (US);
Abstract
Methods and systems are presented to analyze a retinal image of an eye and assigns features to known anatomical structures such as retinal layers. One example method includes receiving interferometric image data of an eye. A set of features is identified in the image data. A first subset of identified features is associated with known retinal structures using prior knowledge. A first set of characteristic metrics is determined of the first subset of features. A second set of characteristic metrics is determined of a second subset of features. Using the characteristic metrics of the first and the second sets, the second subset of features is associated with the retinal structures. Another example method includes dividing interferometric image data into patches. The image data in each patch is segmented to identify one or more layer boundaries. The segmentation results from each patch are stitched together into a single segmentation dataset.