The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
May. 04, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Hanns-Ingo Maack, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to an apparatus () for feature suppression in dark field or phase contrast X-ray imaging. The apparatus comprises an input unit (), a processing unit () and an output unit (). The input unit is configured to provide the processing unit with an X-ray attenuation image of a region of interest of an object. The input unit is also configured to provide the processing unit with a dark field or phase contrast X-ray image of the region of interest of the object. The processing unit is further configured to identify a first feature in the X-ray attenuation image; to identify a second anatomical feature in the X-ray attenuation image; and to identify the second anatomical feature in the dark field or phase contrast X-ray image. The first feature is an obscuring anatomical feature depicted in the X-ray attenuation image with higher contrast than in the dark field or phase contrast X-ray image. The processing unit is also further configured to register the dark field or phase contrast X-ray image to the X-ray attenuation image based on the identified second anatomical feature. The processing unit is configured to determine a location of the first feature in the X-ray attenuation image; and to locate the first feature in the dark field or phase contrast X-ray image comprising utilization of information relating to the first feature identified in the X-ray attenuation image by transferring the determined location to the dark field or phase contrast X-ray image. The processing unit is still further configured to suppress the first feature in the dark field or phase contrast X-ray image to generate a feature suppressed dark field or phase contrast X-ray image. And the output unit is configured to output data representative of the feature suppressed dark field or phase contrast X-ray image.